With the advancement of fabrication technology post-manufacturing test of VLSI circuits is facing new challenges. The test team members of Advanced VLSI Deign Laboratory have been working on various projects and novel approaches to circuit testing. Testing of the chips designed and fabricated in-house are carried out by this group. Design activities related to ATPG and DFT for both analog and digital chips have been taken up. Research in the areas of DFT compliant Analog and Digital chips with BIST capabilities have been undertaken. In addition, practical training of students in advanced electronic circuit testing has been carried out. Areas of strength include:
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